|  | /* | 
|  | *  linux/include/linux/mtd/bbm.h | 
|  | * | 
|  | *  NAND family Bad Block Management (BBM) header file | 
|  | *    - Bad Block Table (BBT) implementation | 
|  | * | 
|  | *  Copyright (c) 2005-2007 Samsung Electronics | 
|  | *  Kyungmin Park <kyungmin.park@samsung.com> | 
|  | * | 
|  | *  Copyright (c) 2000-2005 | 
|  | *  Thomas Gleixner <tglx@linuxtronix.de> | 
|  | * | 
|  | * This program is free software; you can redistribute it and/or modify | 
|  | * it under the terms of the GNU General Public License version 2 as | 
|  | * published by the Free Software Foundation. | 
|  | */ | 
|  | #ifndef __LINUX_MTD_BBM_H | 
|  | #define __LINUX_MTD_BBM_H | 
|  |  | 
|  | /* The maximum number of NAND chips in an array */ | 
|  | #ifndef NAND_MAX_CHIPS | 
|  | #define NAND_MAX_CHIPS		8 | 
|  | #endif | 
|  |  | 
|  | /** | 
|  | * struct nand_bbt_descr - bad block table descriptor | 
|  | * @param options	options for this descriptor | 
|  | * @param pages		the page(s) where we find the bbt, used with | 
|  | *			option BBT_ABSPAGE when bbt is searched, | 
|  | *			then we store the found bbts pages here. | 
|  | *			Its an array and supports up to 8 chips now | 
|  | * @param offs		offset of the pattern in the oob area of the page | 
|  | * @param veroffs	offset of the bbt version counter in the oob are of the page | 
|  | * @param version	version read from the bbt page during scan | 
|  | * @param len		length of the pattern, if 0 no pattern check is performed | 
|  | * @param maxblocks	maximum number of blocks to search for a bbt. This number of | 
|  | *			blocks is reserved at the end of the device | 
|  | *			where the tables are written. | 
|  | * @param reserved_block_code	if non-0, this pattern denotes a reserved | 
|  | *			(rather than bad) block in the stored bbt | 
|  | * @param pattern	pattern to identify bad block table or factory marked | 
|  | *			good / bad blocks, can be NULL, if len = 0 | 
|  | * | 
|  | * Descriptor for the bad block table marker and the descriptor for the | 
|  | * pattern which identifies good and bad blocks. The assumption is made | 
|  | * that the pattern and the version count are always located in the oob area | 
|  | * of the first block. | 
|  | */ | 
|  | struct nand_bbt_descr { | 
|  | int options; | 
|  | int pages[NAND_MAX_CHIPS]; | 
|  | int offs; | 
|  | int veroffs; | 
|  | uint8_t version[NAND_MAX_CHIPS]; | 
|  | int len; | 
|  | int maxblocks; | 
|  | int reserved_block_code; | 
|  | uint8_t *pattern; | 
|  | }; | 
|  |  | 
|  | /* Options for the bad block table descriptors */ | 
|  |  | 
|  | /* The number of bits used per block in the bbt on the device */ | 
|  | #define NAND_BBT_NRBITS_MSK	0x0000000F | 
|  | #define NAND_BBT_1BIT		0x00000001 | 
|  | #define NAND_BBT_2BIT		0x00000002 | 
|  | #define NAND_BBT_4BIT		0x00000004 | 
|  | #define NAND_BBT_8BIT		0x00000008 | 
|  | /* The bad block table is in the last good block of the device */ | 
|  | #define NAND_BBT_LASTBLOCK	0x00000010 | 
|  | /* The bbt is at the given page, else we must scan for the bbt */ | 
|  | #define NAND_BBT_ABSPAGE	0x00000020 | 
|  | /* The bbt is at the given page, else we must scan for the bbt */ | 
|  | #define NAND_BBT_SEARCH		0x00000040 | 
|  | /* bbt is stored per chip on multichip devices */ | 
|  | #define NAND_BBT_PERCHIP	0x00000080 | 
|  | /* bbt has a version counter at offset veroffs */ | 
|  | #define NAND_BBT_VERSION	0x00000100 | 
|  | /* Create a bbt if none axists */ | 
|  | #define NAND_BBT_CREATE		0x00000200 | 
|  | /* Search good / bad pattern through all pages of a block */ | 
|  | #define NAND_BBT_SCANALLPAGES	0x00000400 | 
|  | /* Scan block empty during good / bad block scan */ | 
|  | #define NAND_BBT_SCANEMPTY	0x00000800 | 
|  | /* Write bbt if neccecary */ | 
|  | #define NAND_BBT_WRITE		0x00001000 | 
|  | /* Read and write back block contents when writing bbt */ | 
|  | #define NAND_BBT_SAVECONTENT	0x00002000 | 
|  | /* Search good / bad pattern on the first and the second page */ | 
|  | #define NAND_BBT_SCAN2NDPAGE	0x00004000 | 
|  |  | 
|  | /* The maximum number of blocks to scan for a bbt */ | 
|  | #define NAND_BBT_SCAN_MAXBLOCKS	4 | 
|  |  | 
|  | /* | 
|  | * Constants for oob configuration | 
|  | */ | 
|  | #define ONENAND_BADBLOCK_POS	0 | 
|  |  | 
|  | /** | 
|  | * struct bbt_info - [GENERIC] Bad Block Table data structure | 
|  | * @param bbt_erase_shift	[INTERN] number of address bits in a bbt entry | 
|  | * @param badblockpos		[INTERN] position of the bad block marker in the oob area | 
|  | * @param bbt			[INTERN] bad block table pointer | 
|  | * @param badblock_pattern	[REPLACEABLE] bad block scan pattern used for initial bad block scan | 
|  | * @param priv			[OPTIONAL] pointer to private bbm date | 
|  | */ | 
|  | struct bbm_info { | 
|  | int bbt_erase_shift; | 
|  | int badblockpos; | 
|  | int options; | 
|  |  | 
|  | uint8_t *bbt; | 
|  |  | 
|  | int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt); | 
|  |  | 
|  | /* TODO Add more NAND specific fileds */ | 
|  | struct nand_bbt_descr *badblock_pattern; | 
|  |  | 
|  | void *priv; | 
|  | }; | 
|  |  | 
|  | /* OneNAND BBT interface */ | 
|  | extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); | 
|  | extern int onenand_default_bbt (struct mtd_info *mtd); | 
|  |  | 
|  | #endif				/* __LINUX_MTD_BBM_H */ |