blob: 57dd1345c437b96bd4f9e469f8cd7f17c04638ff [file] [log] [blame]
* Copyright (C) 2013 Google, Inc
* SPDX-License-Identifier: GPL-2.0+
#include <common.h>
#include <dm.h>
#include <fdtdec.h>
#include <spi.h>
#include <spi_flash.h>
#include <asm/state.h>
#include <dm/ut.h>
#include <dm/test.h>
#include <dm/util.h>
/* Test that sandbox SPI flash works correctly */
static int dm_test_spi_flash(struct dm_test_state *dms)
* Create an empty test file and run the SPI flash tests. This is a
* long way from being a unit test, but it does test SPI device and
* emulator binding, probing, the SPI flash emulator including
* device tree decoding, plus the file-based backing store of SPI.
* More targeted tests could be created to perform the above steps
* one at a time. This might not increase test coverage much, but
* it would make bugs easier to find. It's not clear whether the
* benefit is worth the extra complexity.
ut_asserteq(0, run_command_list(
"sb save hostfs - spi.bin 0 200000;"
"sf probe;"
"sf test 0 10000", -1, 0));
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;